德国菲希尔DUALSCOPE® FMP20涂层测厚仪
德国菲希尔DUALSCOPE® FMP20涂层测厚仪采用了磁性和涡流两种测厚方法，可无损地测量磁性金属基体( 如钢、铁、合金和硬磁性钢等 )上非磁性覆盖层的厚度(如铝、铬、铜、珐琅、橡胶、油漆等)及非磁性金属基体(如铜、铝、锌、锡等)上非导电覆盖层的厚度(如:珐琅、橡胶、油漆、塑料等)。
德国菲希尔DUALSCOPE® FMP20涂层测厚仪能够自动根据基材的不同而切换到相应的工作模式
具有磁感应和涡流各自的校准和零位功能
连续测量功能，能得出稳定的结果
大窗口液晶带二行点阵对话显示，操作更明确
公英制单位设置
上下限设置，一旦超限，有不同的蜂鸣声提示音
具有数据统计功能：平均值、最大值、最小值、标准偏差、测量次数
键盘锁功能，防止误校准
另购传输软件和专用电缆可将仪器里的数据传输到电脑的Excel界面，方便编辑和打印。
新款DUALSCOPE® FMP40作为FMP30-40系列的一部分，比标准版仪器具有更广泛的可用性。
这些仪器集成了许多附加的功能，如最多可达100个应用程式及相应的统计学和图形评估。
将容差限输入可校准应用程式后，生产过程可以进行统计地分析。常规模式可以转换到矩阵模式，以便于进行多点相关联的测试。.
FMP10,FMP20,FMP30,FMP40涂层测厚仪技术参数
FD10双功能探头测量参数：磁感应：测量范围：0～1500μΜ（0～60 mils）测量精度：0～50 μΜ：0.2 μΜ 50～1500μΜ： 1 ％。涡流：测量范围：0～1200μΜ（0～48 mils）测量精度：0～100 μΜ：0.5 μΜ，100～1200μΜ： 0.5 ％
以上介绍的只是其中极小一部分的功能特性。
- Automatic base material recognition
- For magnetic inductive and eddy current probes
Features additional to those of the Basic series:
- Memory for up to 20,000 readings
- Up to 100 calibratable applications
- Capability of allocating readings into up to 4,000 Blocks
- Date and time stamp for blocks
- Statistics display of common characteristic values in the block and final results. Output of characteristic variance-analytical values
- Graphical measurement display as a histogram with a Gaussian plot
- Capability of entering process tolerance limits and computation of the associated process capability indices cp and cpk
- Audible and visual warning when tolerance limits are exceeded
- Free-running display with additional presentation of the reading as an analog bar between the tolerance limits
- External key-triggered measurement acquisition, e.g., in hollow cylinders with small diameters
- Option to calibrate through an unknown coating (with magnetic induction method only)
- Capability to enable matrix measurement mode for connected multi-point measurements
- Capability of averaging measurement data: Only the mean value of several readings will be stored
- Measurement acquisition through area measurement possible: Only the single readings until probe lift-off are captured and averaged
- Capability to measure continuously with the probe placed on the specimen
- Outlier rejection for the automatic elimination of erroneous measurements
- Correction of any stored reading
- Application linking mode: Ability for common normalization/calibration of applications
- Designations for applications through the optional PC program MP-Name
- USB port to a printer
- Battery and line power operation
